Shaheen Layaq Software Defect All Books sku-16701258818

Shaheen Layaq sku-16701258818 is listed under All Books. Machine Learning Approaches for Software Defect Prediction is a paperback attributed to LAP Lambert Academic Publishing. ISBN: 9786208012199. Publication date: 2025-05-05. Page count: 124.You may also like Francisco Rodrigues Lima-Junior sku-15143674307 Hardcover.