Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback)

Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, (Paperback) Author: Springer ISBN: 9781489983145 Format: Paperback Publication Date: 2014-09-03 Page Count: 171You may also like Approximate Computing Techniques: From Component- To Application-Level, (Paperback).